KritiScan® 100100DV - Dual View X-ray Baggage Scanner

Traditional baggage scanners are based on X-ray attenuation technology. In this technology, the detection of threat objects relies on how various objects differently attenuate the X-ray beams passing through them. But in recent times, this capability has been enhanced by the use of dual-energy/view X-ray scanners. Dual View Technology produces two screening perspectives that enhance the operator’s ability to identify potential security threats with increased accuracy and speed. KritiScan® 100100 DV is an advanced Dual-energy X-ray baggage scanner designed and developed by Vehant Technologies with Tunnel size - 1000 mm (W) X 1000 mm (H).
It uses innovative dual-view technology for generating a horizontal and vertical view of the object under inspection. A Dual View system provides dual-dimensional views of the scanned object which help in enhanced detection of contraband objects.